Fast integrated circuits (ICs) are used in many ways in applied electronics. Especially, for hard driven fast or high-power components in the circuit, however, there is often a risk of breakdown, e.g. in oscillator circuits (radar systems, etc.) or “smart power” circuits. At the pn junctions present in all components, the breakdown occurs starting at a critical field strength. The circuit is thus destroyed or becomes unusable. A photodiode-controlled feedback prevents breakdown at pn junctions.
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